digital micrograph software version 3 7 4 (Gatan Inc)
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Gatan Inc
digital micrograph software version 3 7 4
Digital Micrograph Software Version 3 7 4, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/digital+micrograph+software+version+3+7+4/10__1016_slash_j__arabjc__2023__105010-89-10-15
Average 86 stars, based on 1 article reviews
Digital Micrograph Software Version 3 7 4, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/digital+micrograph+software+version+3+7+4/10__1016_slash_j__arabjc__2023__105010-89-10-15
Average 86 stars, based on 1 article reviews
digital micrograph software version 3 7 4 - by Bioz Stars,
2026-09
86/100 stars
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Related Articles
Software:Article Title: The Phase Evolution and Photocatalytic Properties of a Ti-TiO2 Bilayer Thin Film Prepared Using Thermal Oxidation Article Snippet: Microstructural and oxidation layer observations of the thin-film cross-sectional and plane-view morphology grown onto glass substrates were made with field-emission gun transmission electron microscopy (FEG-TEM; FEI E.O Tecnai F20, FEI Company—Thermo Fisher Scientific, Hillsboro, OR, USA) equipped with an energy-dispersive spectrophotometer at an acceleration voltage of 200 kV. .. Selected-area electron diffraction (SAED) and nano-beam electron diffraction (NBED) were performed using Gatan Software Article Title: Photocatalytic antimicrobial and photostability studies of TiO2/ZnO thin films Article Snippet: Sample preparation for the TEM was performed using a Focused Ion Beam (FIB) (Hitachi NX2000, Hitachi High-Tech, USA). .. Selected area electron diffraction (SAED) was analyzed using Gatan Software Article Title: Insight on Photocatalytic and Photoinduced Antimicrobial Properties of ZnO Thin Films Deposited by HiPIMS through Thermal Oxidation Article Snippet: A high-order three-beam focused ion beam microscope (FIB) (Hitachi NX2000, Hitachi High-Tech Cooperation, Minato, Tokyo, Japan) was used to prepare the TEM sample. .. Fast Fourier transform (FFT) was performed using Gatan Software |